Random power supply as a test vector to expose soft defects in CMOS digital circuits

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Kamisian, Izam
التنسيق:	أطروحة
منشور في:	2000
الموضوعات:	TK Electrical engineering. Electronics Nuclear engineering

مواد مشابهة

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