Investigation of intermediate layer for Ag/Si metal-semiconductor contacts
The intermediate layer is a crucial component in thin film metal contacts. In determining Ohmic characteristics, selection of materials used as metal contact can affect device performance. However, in determine a good electrical conductor, it depends on their physical structure which is formed by mo...
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| Format: | Thesis |
| Language: | English English English |
| Published: |
2019
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| Online Access: | http://eprints.uthm.edu.my/478/ |
| Abstract | Abstract here |