Investigation of intermediate layer for Ag/Si metal-semiconductor contacts

The intermediate layer is a crucial component in thin film metal contacts. In determining Ohmic characteristics, selection of materials used as metal contact can affect device performance. However, in determine a good electrical conductor, it depends on their physical structure which is formed by mo...

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Bibliographic Details
Main Author:	Bahri, Bibi Zulaika
Format:	Thesis
Language:	English English English
Published:	2019
Subjects:	QC501-766 Electricity and magnetism
Online Access:	http://eprints.uthm.edu.my/478/
Abstract	Abstract here

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