Structural and electrical conductivity measurement of zinc oxide thin film prepared by sol-gel dip coating method

Zinc oxide (ZnO) exhibits a hexagonal wurtzitic structure with a wide direct energy band gap of 3.37 eV. Furthermore, the ZnO thin films have low resistivity and high transparency in visible region and thus can be used as the fundamental layer in the fabrication of optoelectronic devices and as the...

وصف كامل

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Peh, Ly Tat
التنسيق:	أطروحة
اللغة:	الإنجليزية
منشور في:	2015
الموضوعات:	QC Physics
الوصول للمادة أونلاين:	http://eprints.utm.my/81443/1/PehLyTatMFS2015.pdf

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