Compact multiport reflectometer for microwave material characterization
In this project, a simple, innovative, and compact three-probe reflectometer has been developed. The reflectometer can be used to find the complex reflection coefficient of an unknown device under test over a relatively broad frequency range based on the three measured power amplitudes of the three...
| मुख्य लेखक: | |
|---|---|
| स्वरूप: | थीसिस |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
2020
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| विषय: | |
| ऑनलाइन पहुंच: | http://eprints.utm.my/93004/1/ObaidallahIbrahimMSKE2020.pdf |