Compact multiport reflectometer for microwave material characterization
In this project, a simple, innovative, and compact three-probe reflectometer has been developed. The reflectometer can be used to find the complex reflection coefficient of an unknown device under test over a relatively broad frequency range based on the three measured power amplitudes of the three...
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة |
| اللغة: | الإنجليزية |
| منشور في: |
2020
|
| الموضوعات: | |
| الوصول للمادة أونلاين: | http://eprints.utm.my/93004/1/ObaidallahIbrahimMSKE2020.pdf |