Control chart patterns recognition with constrained data

Recognition and classification of non-random patterns of manufacturing process data can provide clues to the possible causes that contributed to the product defects. Early detection of abnormal process patterns, particularly in highly precise and rapid automated manufacturing is necessary to avoid w...

詳細記述

書誌詳細

第一著者:	Haghighati, Razieh
フォーマット:	学位論文
言語:	英語
出版事項:	2019
主題:	TJ Mechanical engineering and machinery
オンライン･アクセス:	http://eprints.utm.my/98011/1/RaziehHaghighatiPSKM2019.pdf