Nanoscale microstructural characterization of aluminum and copper bilayer thin films deposited on silicon substrate using magnetron sputtering technique

類似資料

• Structural and surface morphology of nanocystalline bismuth telluride thin films deposited using radio frequency magnetron sputtering
  著者:: Emilly Albert Alim
  出版事項: (2025)
• Structural and optical properties of RF-sputtered Ge thin films using magnetron sputtering technique
  著者:: Ariffin, Nurul Assikin
  出版事項: (2018)
• Magnetoresistance of CuCoNi, CuCo and AlFeNi Granular Thin Films Prepared by RF Magnetron Sputtering
  著者:: Yu, Ong Sing
  出版事項: (2002)
• Giant Magnetoresistance of Silver Nickel Iron Grandular Magnetic Thin Films Prepared by RF Magnetron Sputtering System
  著者:: Lim, Kean Pah
  出版事項: (1998)
• RF magnetron sputtered YSZ thin films: fabrication and characterization
  著者:: Shahrul Razi bin Meskon
  出版事項: (2024)