APA (7th ed.) Citation

Halim, Z. A. A., & Muhamad Azizi Mat Yajid, s. (2025). Nanoscale microstructural characterization of aluminum and copper bilayer thin films deposited on silicon substrate using magnetron sputtering technique. Universiti Teknologi Malaysia.

Chicago Style (17th ed.) Citation

Halim, Zulhelmi Alif Abdul, and supervisor Muhamad Azizi Mat Yajid. Nanoscale Microstructural Characterization of Aluminum and Copper Bilayer Thin Films Deposited on Silicon Substrate Using Magnetron Sputtering Technique. Universiti Teknologi Malaysia, 2025.

MLA (9th ed.) Citation

Halim, Zulhelmi Alif Abdul, and supervisor Muhamad Azizi Mat Yajid. Nanoscale Microstructural Characterization of Aluminum and Copper Bilayer Thin Films Deposited on Silicon Substrate Using Magnetron Sputtering Technique. Universiti Teknologi Malaysia, 2025.