An efficient march (5n) FSM-Based Memory Built-In Self-Test (MBIST) architecture with diagnosis capabilities

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Bibliographic Details
Main Author:	Ng, Kok Heng
Other Authors:	Nurul Ezaila Alias, supervisor
Format:	Master's thesis
Language:	English
Published:	Universiti Teknologi Malaysia 2025
Subjects:	Electrical engineering
Online Access:	https://utmik.utm.my/handle/123456789/40835
Abstract	Abstract here

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