Study of Time-Dependent Dielectric Breakdown (TDDB) in 15MM junctionless FinFET

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Bibliographic Details
Main Author:	Chng, Sze Lyn
Other Authors:	Nurul Ezaila Alias, supervisor
Format:	Master's thesis
Language:	English
Published:	Universiti Teknologi Malaysia 2025
Subjects:	Electrical engineering
Online Access:	https://utmik.utm.my/handle/123456789/40860
Abstract	Abstract here

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