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Gate-all-around floating-gate (GAA-FG) with variable oxide thickness for nonvolatile memory

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Bibliographic Details
Main Author: Muhammad Faris Bahrudin
Language:English
Published: Universiti Teknologi Malaysia 2025
Subjects:
Electrical engineering
Online Access:https://utmik.utm.my/handle/123456789/54232
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https://utmik.utm.my/handle/123456789/54232

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