Test vectors reduction for integrated circuit testing using horizontal hamming distance

Also available in printed version

Bibliographic Details
Main Author:	Arbab Alamgir
Other Authors:	Abu Khari A'ain, supervisor
Format:	Master's thesis
Language:	English
Published:	Universiti Teknologi Malaysia 2025
Subjects:	Electrical engineering
Online Access:	https://utmik.utm.my/handle/123456789/55136
Abstract	Abstract here

Internet