APA引文

Alamgir, A., & Abu Khari A'ain, s. (2025). Test vectors reduction for integrated circuit testing using horizontal hamming distance. Universiti Teknologi Malaysia.

Chicago Style (17th ed.) Citation

Alamgir, Arbab, and supervisor Abu Khari A'ain. Test Vectors Reduction for Integrated Circuit Testing Using Horizontal Hamming Distance. Universiti Teknologi Malaysia, 2025.

MLA引文

Alamgir, Arbab, and supervisor Abu Khari A'ain. Test Vectors Reduction for Integrated Circuit Testing Using Horizontal Hamming Distance. Universiti Teknologi Malaysia, 2025.

警告：這些引文格式不一定是100％准確.