Test vectors reduction for integrated circuit testing using horizontal hamming distance

Also available in printed version

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Arbab Alamgir
مؤلفون آخرون:	Abu Khari A'ain, supervisor
التنسيق:	Master's thesis
اللغة:	الإنجليزية
منشور في:	Universiti Teknologi Malaysia 2025
الموضوعات:	Electrical engineering
الوصول للمادة أونلاين:	https://utmik.utm.my/handle/123456789/55136
Abstract	Abstract here

مواد مشابهة

Improving on board integrated circuits testing using one shared test access port and single bidirectional test data line
حسب: Salim Ahmad, Jayousi
منشور في: (2015)

Design and analysis of electrical testing probe for semiconductor integrated circuit
حسب: Wong, Michael Loke Peng
منشور في: (2016)

Development of a test circuit board for VLSI circuit testing using mixed-mode approach
حسب: Islam Syed Zahidul
منشور في: (2023)

An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits.
حسب: Altaf-ul-Amin Md
منشور في: (2023)

VLSI circuit testing using probabilistic approach
حسب: Ahmed Iftekhar
منشور في: (2023)

Optimum distance of lift-off height to detect defect on testing materials using eddy current testing technique
حسب: Salmia Santa
منشور في: (2020)

Enhanced test pattern generator for block box testing
حسب: Muhammad Sadiq Sahari
منشور في: (2025)

Optimizing Ram Testing Method For Test Time Saving Using Automatic Test Equipment
حسب: Kesavan Prabagaran, Premkumar
منشور في: (2017)

A Test Vector Minimization Algorithm Based On Delta Debugging For Post-Silicon Validation Of Pcie Rootport
حسب: Toh , Yi Feng
منشور في: (2017)

Testing of power electronics systems using hardware in the loop
حسب: Noor Zalika Kornain
منشور في: (2025)

Hybrid test at register transfer level
حسب: Lim, Chin Beng
منشور في: (2025)

Test suite reduction in android application using refactoring
حسب: Ahmed, Maryam Temitayo
منشور في: (2016)

Development of Test Procedure For CMOS Operational Amplifier Application Circuits
حسب: Abdul Halin, Izhal
منشور في: (2002)

Frequency reuse and power control for interference mitigation in femtocell lte-a network / Khalil Ahmed Qasem As'ham
حسب: Khalil Ahmed , Qasem As'ham
منشور في: (2017)

Test cases reduction using similarity relation and conditional entropy
حسب: Md Nasir, Noor Fardzilawati
منشور في: (2017)

Thermal-safe system-on-chip test scheduling using dynamic voltage and frequency scaling
حسب: Hasliza Hassan
منشور في: (2025)

Adopting A Particle Swarm-Based Test Generator Strategy For Variable-Strength And T-Way Testing
حسب: S. Ahmed, Bestoun
منشور في: (2011)

Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
حسب: Salehuddin, Muhammad Redzwan
منشور في: (2017)

On-wafer noise figure characterization for radio frequency integrated circuits.
حسب: Mohd, Shukri Korakkottil Kunhi
منشور في: (2011)

Development of an integrated circuit topology using multilevel inverter and matrix converter
حسب: Al-Mahrouk, Akram Mohammed
منشور في: (2020)

Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach
حسب: Maria Amirtha Raj, Michel Raj
منشور في: (2017)

A parallel built-in self-test design for photon counting array
حسب: Png, Ricky Keh Jing
منشور في: (2025)

Estimation of fault distance location using artificial neural network
حسب: Mohamad Fadli Adlizam Saramuji
منشور في: (2025)

Digital logic circuit design using adiabatic approach
حسب: Nurul Aisyah Nadiah Zainal Abidin
منشور في: (2025)

Performance analysis of ad hoc on-demand distance vector routing protocol under the real world implementation and simulation environment / Yusnani Mohd Yussoff
حسب: Mohd Yussoff, Yusnani
منشور في: (2007)

Integrated circuit design of a multiplier-accumulator for convolutional neural network based on carry-save adder architecture
حسب: Lee, Mei Xiang
منشور في: (2025)

Distance vector-hop range-free location algorithm for wireless sensor network
حسب: Zazali, Azyyati Adiah
منشور في: (2015)

Design and analysis of remote monitoring and testing of telephone for highways
حسب: Hushairi, Bin Hj. Zen
منشور في: (2001)

Penilaian integriti struktur robi test bed (road bridge interface test bed) di atas tanah lembut
حسب: Md Zain, Rasimah
منشور في: (2013)

Automated Acceptance Testing Tool For Requirements Validation
حسب: Nor Aiza, Moketar
منشور في: (2013)

Improvement of molding process scheduled downtime reduction for integrated circuits package DPAK STS
حسب: Heng, Soo Ann
منشور في: (2016)

Improved space vector modulation with reduced switching vectors for multi-phase matrix converter
حسب: SK. Moin Ahammed
منشور في: (2025)

Detection of cross-country fault on distance protection
حسب: Nur Afifah Omar
منشور في: (2025)

Memristor implementation for digital circuit application
حسب: Muhaimin Mohd. Hashim
منشور في: (2025)

Failure of OHM's law and circuit design
حسب: Mohammad Obaidur Rahman
منشور في: (2025)

Fault diagnose and location estimation by using distance relay (voltage and current data)
حسب: Marwan Mhmood Aesa Al-Hamadani
منشور في: (2025)

Simulation of in-memory logic circuit based on probabilistic memristor using LTSPICE
حسب: Ng, Yuh Chyn
منشور في: (2025)

Regression testing framework for test cases generation and prioritization
حسب: Eglal Mohammed Khalifa Osman
منشور في: (2025)

Gloves holes defect evaluation by using electronic air leak testing machine
حسب: Md Din, Mohd Lizan
منشور في: (2017)

Development Of An Automated Test Data Generation And Execution Strategy Using Combinatorial Approach
حسب: Jamil Klaib , Mohammad Fadel
منشور في: (2009)