An efficient march (5n) FSM-based Memory Built-in Self-Test (MBIST) architecture with diagnosis capabilities

In deep submicron Systems-on-Chip, embedded memories are consuming a growing part of the die area. The manufacturing test of embedded memory is a critical stage in the SoC production process that screens out faulty chips and speeds up the volume production of new manufacturing technology. Memory Bui...

詳細記述

書誌詳細

第一著者:	Ng, Kok Heng
フォーマット:	学位論文
言語:	英語
出版事項:	2022
主題:	TK Electrical engineering. Electronics Nuclear engineering
オンライン･アクセス:	http://eprints.utm.my/99546/1/NgKokHengMSKE2022.pdf