An efficient march (5n) FSM-based Memory Built-in Self-Test (MBIST) architecture with diagnosis capabilities
In deep submicron Systems-on-Chip, embedded memories are consuming a growing part of the die area. The manufacturing test of embedded memory is a critical stage in the SoC production process that screens out faulty chips and speeds up the volume production of new manufacturing technology. Memory Bui...
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| Format: | Thèse |
| Langue: | anglais |
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2022
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| Accès en ligne: | http://eprints.utm.my/99546/1/NgKokHengMSKE2022.pdf |